1008/E-V-1.5N-AU-0.5 | PTR

ICT spring loaded contacts, type PTR 10.

Design A: concave 90°, for connector pins, wire-wrap posts and straight / curved terminals. To be used on clean PCB because of the risk of contamination. Design B: pointed tip 30°, for PCB traces, through-plating, solder joints, and test pads. Design BST: sharp steel needle with a long implement life for reliable penetration of flux and dirt on uncleaned PCBs or modules and for SMD contacts. Design C: serrated, A universal head for straight or curved hookup wires, wire-wrap posts and connector pins. Design D: round head, for contacting PCB traces and contact surfaces. The round tip does not leave marks on the contact surface. Also used to contact socket contacts in connectors. Design F: flat head suitable for tabs and convex, clean contact surfaces for preventing damage to surfaces. Design G: four-point crown, for hookup wires, solder joints and test pads without heavy contamination. Design H: pyramid, contact to plated through-holes without problems, also suitable for use on objects with flux residue. Design M: crown, with overlapping center tip. The crown and central tip combination ensures reliable contact at almost any test point. The overlapping center tip fixes the probe tip. Design Q: 4-point crown, self-cleaning, for contacting on heavily soiled PCBs. The special cut of the tip discharges dirt to the outside. Design V: tip 39° (V1 tip 86°), lance, aggressive tip, conceived for open and closed vias and planar surfaces. Penetrates flux and dirt.

Test probes with probe tip, series 1008.

Grid. 1.27 mm; Maximum travel: 6.4 mm. Working travel: 4.3 mm. Spring force at working travel (±20 %): 1.5 N. Spring prestress: 0.4 N. Current load: 2.0 to 3.0 A. Contact resistance: typically 20 mohm. Barrel: gold-plated bronze. Spring: gold-plated spring steel.

ICT spring force contacts, type 1008/E.

Technical attributes (type, tip shape, tip diameter, plunger material): 1008/E-V-1,5 N-Au-0,5C, V, 0.5 mm, CuBe.