1010-B-0.8NE-AU-0.45 | PTR

Standard spring contacts, type PTR 10.

Design A: concave 90°, For connector pins, wire-wrap posts and straight / bent terminals. To be used on clean PCB because of the risk of contamination. Design B: pointed tip 30°, for PCB traces, through-plating, solder joints, and test pads. Design BS: practical flexible needle, reliable point-of use penetration of flux and coiling on unwashed PCBs, modules, or SMDs. Design C: serrated, A universal head for straight or curved hookup wires, wire-wrap posts and connector pins. Design D: round head, for contacting PCB traces and contact surfaces. The round tip does not leave marks on the contact surface. Also used to contact socket contacts in connectors. Design G: four-point crown, for hookup wires, solder joints and test pads without heavy contamination. Design H: pyramid, contact to vias without problems, also suitable for use on objects with flux residue. Form Q: four-point crown, self-cleaning, designed to test contaminated printed circuit boards. The special cut of the tip allows UCx005F UCx000D UC contaminates to fall out easily.

Test probes with probe tip series 1010.

Grid: 1.91 mm. Maximum travel: 3.0 mm. Working stroke: 2.4 mm. Spring force at working stroke (±20 %): 0.8 N. Spring prestress: 0.2 N. Current load capacity: 2.0 A. Contact resistance: typ. 20 mohm. Barrel: gold-plated bronze. Spring: stainless steel, nickel-plated.

Technical attributes (type, tip shape, tip diameter, plunger material): 1010-B-0,8 N-Au-1,5, B, 0.45 mm, steel.